Dylan F. Williams

Publication Activity (10 Years)

Years Active: 2006-2023
Publications (10 Years): 6

Top Topics

Measurement Error

National Institute Of Standards And Technology

Top Venues

IEEE Trans. Instrum. Meas.

Publications

Rob D. Jones, Jerome Cheron, Bryan T. L. Bosworth, Benjamin F. Jamroz, Dylan F. Williams, Miguel E. Urteaga, Ari D. Feldman, Peter H. Aaen
Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz. BCICTS (2023)
Jerome Cheron, Rob D. Jones, Richard A. Chamberlin, Dylan F. Williams, Miguel E. Urteaga, Kassiopeia A. Smith, Nicholas R. Jungwirth, Bryan T. L. Bosworth, Christian J. Long, Nathan D. Orloff, Peter H. Aaen, Ari D. Feldman
High-Gain 500-GHz InP HBT Power Amplifiers. BCICTS (2021)
Peter G. Vouras, Jeanne T. Quimby, Benjamin F. Jamroz, Alec Weiss, Rodney Leonhardt, Dylan F. Williams, Kate A. Remley
Frequency Invariant Beampatterns for Wideband Synthetic Aperture Channel Sounders. SPAWC (2020)
Dazhen Gu, Xifeng Lu, Benjamin F. Jamroz, Dylan F. Williams, Xiaohai Cui, Aric W. Sanders
NIST-Traceable Microwave Power Measurement in a Waveguide Calorimeter With Correlated Uncertainties. IEEE Trans. Instrum. Meas. 68 (6) (2019)
Dylan F. Williams, Jerome Cheron, Benjamin F. Jamroz, Richard Chamberlin
On-Wafer Transistor Characterization to 750 GHz - the Approach, Results, and Pitfalls. BCICTS (2018)
Peter G. Vouras, Alec Weiss, Maria Becker, Ben Jamroz, Jeanne T. Quimby, Dylan F. Williams, Kate A. Remley
Gradient-based Solution of Maximum Likelihood Angle Estimation for Virtual Array Measurements. GlobalSIP (2018)
Paul D. Hale, Jeffrey A. Jargon, Chih-Ming Jack Wang, Brett Grossman, Mathew Claudius, José L. Torres, Andrew Dienstfrey, Dylan F. Williams
A Statistical Study of De-Embedding Applied to Eye Diagram Analysis. IEEE Trans. Instrum. Meas. 61 (2) (2012)
Chih-Ming Jack Wang, Paul D. Hale, Jeffrey A. Jargon, Dylan F. Williams, Kate A. Remley
Sequential Estimation of Timebase Corrections for an Arbitrarily Long Waveform. IEEE Trans. Instrum. Meas. 61 (10) (2012)
Jack C. M. Wang, Paul D. Hale, Dylan F. Williams
Uncertainty of Timebase Corrections. IEEE Trans. Instrum. Meas. 58 (10) (2009)
Paul D. Hale, Andrew Dienstfrey, Jack C. M. Wang, Dylan F. Williams, Arkadiusz Lewandowski, D. A. Keenan, Tracy S. Clement
Traceable Waveform Calibration With a Covariance-Based Uncertainty Analysis. IEEE Trans. Instrum. Meas. 58 (10) (2009)
Paul D. Hale, C. M. Wang, Dylan F. Williams, Kate A. Remley, Joshua D. Wepman
Compensation of Random and Systematic Timing Errors in Sampling Oscilloscopes. IEEE Trans. Instrum. Meas. 55 (6) (2006)