David Han

Publication Activity (10 Years)

Years Active: 2015-2022
Publications (10 Years): 5

Top Topics

Top Venues

IEEE Trans. Reliab.

Reliab. Eng. Syst. Saf.

Commun. Stat. Simul. Comput.

Qual. Reliab. Eng. Int.

Publications

David Han, Tianyu Bai
Optimal planning of progressively Type-I censored step-stress accelerated life test under interval inspection. Commun. Stat. Simul. Comput. 51 (12) (2022)
David Han, Tianyu Bai
Parameter Estimation Using EM Algorithm For Lifetimes From Step-Stress and Constant-Stress Accelerated Life Tests With Interval Monitoring. IEEE Trans. Reliab. 70 (1) (2021)
David Han
On the Existence of the Optimal Step-Stress Accelerated Life Tests Under Progressive Type-I Censoring. IEEE Trans. Reliab. 69 (3) (2020)
David Han, Tianyu Bai
Design optimization of a simple step-stress accelerated life test - Contrast between continuous and interval inspections with non-uniform step durations. Reliab. Eng. Syst. Saf. 199 (2020)
David Han
Optimal design of a simple step-stress accelerated life test under progressive type I censoring with nonuniform durations for exponential lifetimes. Qual. Reliab. Eng. Int. 35 (5) (2019)
David Han
Time and cost constrained optimal designs of constant-stress and step-stress accelerated life tests. Reliab. Eng. Syst. Saf. 140 (2015)
David Han, Debasis Kundu
Inference for a Step-Stress Model With Competing Risks for Failure From the Generalized Exponential Distribution Under Type-I Censoring. IEEE Trans. Reliab. 64 (1) (2015)