Ananda Sen

Publication Activity (10 Years)

Years Active: 1996-2019
Publications (10 Years): 1

Top Topics

Parameter Values

Statistical Inference

Conditionally Independent

Bayesian Models

Top Venues

Comput. Stat. Data Anal.

Publications

Philip S. Boonstra, Ryan P. Barbaro, Ananda Sen
Default priors for the intercept parameter in logistic regressions. Comput. Stat. Data Anal. 133 (2019)
Anupap Somboonsavatdee, Ananda Sen
Statistical Inference for Power-Law Process With Competing Risks. Technometrics 57 (1) (2015)
Ananda Sen, Nandini Kannan, Debasis Kundu
Bayesian planning and inference of a progressively censored sample from linear hazard rate distribution. Comput. Stat. Data Anal. 62 (2013)
David E. Goodrich, Lorraine R. Buis, Adrienne W. Janney, Megan D. Ditty, Christine W. Krause, Kai Zheng, Ananda Sen, Victor J. Strecher, Michael L. Hess, John D. Piette, Caroline R. Richardson
Integrating an internet-mediated walking program into family medicine clinical practice: a pilot feasibility study. BMC Medical Informatics Decis. Mak. 11 (2011)
Ananda Sen, Arthur Fries
Comment. Technometrics 52 (4) (2010)
Nibedita Bandyopadhyay, Ananda Sen
Bayesian Modeling of Recurrent Event Data with Dependent Censoring. Commun. Stat. Simul. Comput. 39 (3) (2010)
Anupap Somboonsavatdee, Vijayan N. Nair, Ananda Sen
Graphical Estimators From Probability Plots With Right-Censored Data. Technometrics 49 (4) (2007)
Donghoon Han, N. Balakrishnan, Ananda Sen, Evans Gouno
Corrections on "Optimal Step-Stress Test Under Progressive Type-I Censoring". IEEE Trans. Reliab. 55 (4) (2006)
Ananda Sen
Skew-Elliptical Distributions and Their Applications: A Journey Beyond Normality. Technometrics 47 (4) (2005)
Evans Gouno, Ananda Sen, N. Balakrishnan
Optimal step-stress test under progressive type-I censoring. IEEE Trans. Reliab. 53 (3) (2004)
Ananda Sen
Statistical Reliability Engineering. Technometrics 42 (3) (2000)
Ananda Sen
The Theory of Dispersion Models. Technometrics 41 (2) (1999)
Arthur Fries, Ananda Sen
A survey of discrete reliability-growth models. IEEE Trans. Reliab. 45 (4) (1996)